Products - ATE

One platform, one software to cover all your test request.

Discrete devices:

Discrete DC test modules(1000V/100A), optional to 2000V/250A
UIL test module
DVSD test module
Rg/Cg test module
Pico-amp test module
Qg test module

Software features :

Support true parallel test(up to 128 sites in wafer test)
Support Index parallel test with turret handler in final test
support csv. stdf. datalog format
Visual C++ program environment